ElvaX Basic- XRF Spectrometer

ElvaX Basic XRF Spectrometer – Affordable Benchtop Analyzer for Reliable Elemental Analysis

The ElvaX Basic XRF Spectrometer is a cost-effective benchtop XRF analyzer designed for both qualitative and quantitative elemental analysis of solids, liquids, and powders. Covering an element range from sulfur (S) to uranium (U), it delivers accurate results across various concentrations, making it ideal for applications in jewelry, alloy sorting, environmental monitoring, and quality control.

Equipped with a digiX-40 digital X-ray source and a Si-PIN detector (optional SDD), the ElvaX Basic ensures high-speed data acquisition with excellent precision. Its proprietary Dynamically Adaptive Shaping (DAS) digital pulse processor enhances performance, providing rapid and reliable measurements.

The spectrometer’s compact design (430 x 340 x 200 mm) and lightweight build (13 kg) make it suitable for laboratories with limited space. Operating on a user-friendly Windows-based interface, it supports fundamental parameters (FPA), empirical calibrations, and manual spectra comparison, catering to both novice and experienced users.

With features like automatic temperature correction and calibration adjustment, the ElvaX Basic offers long-term stability without the need for frequent recalibration. Its high-performance analytical software ensures precise results, while the ergonomic design enhances user experience.

ElvaX Basic- XRF Spectrometer is a compact cost effective Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer ideally suited for both qualitative and quantitative analysis of solids, liquids and powders in the element range from Cl (Z=17) to U (Z=92) in a wide range of concentrations.

Benefits of ElvaX Basic- XRF Spectrometer

• Low cost
• High speed and accuracy
• Compact. Doesn’t occupy much space on a desk
• Ergonomic design
• High-performance analytical software included

Technical Specifications

Digital X-Ray Source digiX-40

• Anode: W
• Voltage: 40 kV
• Current: 200 uAmp
• Power: 4 W

X-Ray Detector

• Type: Si-PIN (optional SDD)
• Area: 6 mm2 (25 mm2 for SDD)
• Energy resolution: 165 eV at Mn Kα (140 eV for SDD)

Electronics

• DPP: proprietory DAS (Dynamically Adaptive Shaping) type, 80 MHz sampling rate
• MCA: 4096 channels

General

• Dimensions: 430 х 340 х 200 mm
• Weight: 13 kg
• Power supply: 90 – 240 VAC, 50/60 Hz
• Power consumption: 40 W

Software

• Operating system: Windows XP/Vista/7/8/10
• Analysis algorithms: Fundamental parameters (FPA), Empirical (regression) calibrations, Manual spectra comparison