ElvaX Plus – XRF Spectrometer is a desktop energy-dispersive X-ray fluorescence (EDXRF) analyzer with extended element range from Na (Z=11) to U (Z=92). The Helium purge system and the automatic primary filter changer combined with the large area SDD detector are used to allow effective registration of the light elements spectra. ElvaX Plus spectrometer is used for quantitative and qualitative analysis of the elemental composition of metal alloys, liquids, powders, food and biological samples, as well as samples deposited on surfaces or filters, in a wide range of element concentrations. Analyzer’s detecting limit is better than 1 ppm for most elements in a light matrix.
Benefits of ElvaX Plus – XRF Spectrometer
- World’s fastest XRF analyzer (throughput above 400 000 cps) – highest accuracy and excellent precision within the shortest measurement time
- Wide element detection range from Na (Z=11) to U (Z=92)
- Helium purge feature improves sensitivity to light elements (Na, Mg, Al, Si, P, S)
- Excellent calibration stability, compensation of ambient temperature and pressure variations
- Optional 16-position automatic sample changer increases productivity of your lab
- Optional high-resolution CCD camera for precise sample positioning
- Low maintenance cost
Technical Specifications
Digital X-Ray Source digiX-50
- Anode: W, Rh, Ag
- Voltage: 50 kV
- Power: 5 W
- 5 position filter changer
X-Ray Detector
- Type: CSA SDD
- Area: 30 mm2
- Energy resolution: 140 eV at Mn Kα, 85 eV at Al Kα
- Count rate: 500 000 cps
Electronics
- DPP: proprietory DAS (Dynamically Adaptive Shaping) type, 80 MHz sampling rate
- MCA: 4096 channels
General
- Dimensions: 430 х 340 х 200 mm
- Weight: 18 kg
- Power supply: 90 – 240 V, 50/60 Hz
- Power consumption: 40 W
Software
- Operating system: Windows XP/Vista/7/8/10
- Analysis algorithms: Fundamental parameters (FPA), Empirical (regression) calibrations, Manual spectra comparison
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