ElvaX Pro – XRF Spectrometer is the next-generation benchtop X-ray fluorescence analyzer. It offers a new level of analysis accuracy, speed and detection limits for a wide range of elements from Na(11) to U(92) due to the new 60kV, 1000 μA X-ray tube and the ultra large area Fast SDD detector. Powerful hardware combined with unique software algorithms make ElvaX Pro a multipurpose lab instrument for elemental analysis of various materials including solids, powders, liquids etc.
Benefits of ElvaX Pro – XRF Spectrometer
- World’s fastest XRF analyzer (throughput above 500 000 cps) – highest accuracy and excellent precision within the shortest measurement time
- 60 kV X-ray tube voltage allows to analyze rare earth elements using K-series and consistently improves sensitivity to the high-energy elements from Pd (Z=46) to Ba (Z=56)
- Up to 1000 μA X-ray tube current improves accuracy and detection limits for light elements (Na, Mg, Al, Si, P, S) and allows to use small-size collimators (<1mm) for small spot analysis
- Motorized collimator changer for small spot analysis of jewelry, welds etc.
- Helium purge feature improves sensitivity to light elements (Na, Mg, Al, Si, P, S) several times
- 16-position automatic sample changer increases the productivity of your lab
- Sample spinner for analysis of inhomogeneous samples
- Excellent calibration stability, compensation of ambient temperature and pressure influence
- High-resolution CCD camera for precise sample positioning
Technical Specifications
Digital X-Ray Source digiX-60
- Anode: W, Rh, Ag
- Voltage: 60 kV
- Power: 12 W 8 position filter changer 5 position collimator changer
X-Ray Detector
- Type: Large area Fast SDD
- Area: 40 mm2
- Energy resolution: 130 eV at Mn Kα, 85 eV at Al Kα
- Count rate: 500 000 cps
Electronics
- DPP: proprietory DAS (Dynamically Adaptive Shaping) type, 80 MHz sampling rate
- MCA: 4096 channels
General
- Dimensions: 430 х 340 х 200 mm
- Weight: 18 kg
- Power supply: 90 – 240 V, 50/60 Hz
- Power consumption: 50 W
Software
- Operating system: Windows XP/Vista/7/8/10
- Analysis algorithms: Fundamental parameters (FPA), Empirical (regression) calibrations, Manual spectra comparison
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