Four Probe Method Setup


The Four Probe Method is used to accurately measure the resistivity of semiconductors and thin films by eliminating the effects of contact resistance. It is widely used for materials with high resistivity, such as silicon and germanium.

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Resistivity of Semiconductors by Four Probe Method at Different Temperatures and Determination of Band-Gap

The experiment consists of the following

1. Four Probe : Arrangement

2. Oven (upto 200ºC)

3. Sample: Ge Crystal mounted

4. Thermometer (0-200ºC)

5. Four Probe Setup (a) Constant Current power supply digital Accuracy:+0.25% of the reading+1 digit Load Regulation:0.03%for no load to full load (b) Electronic Milli voltmeter 200 mV Accuracy: + 0.1% of reading = 1 digit Impedance: 1 M ohm Display: 3½ digit, 7 segment LED (12.5mm) height with auto polarity and decimal indication.

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